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Merge the two identical definitions of TEST_USES_KEY_ID and mbedtls_test_psa_purge_key_storage from test_suite_psa_crypto_slot_management.function and test_suite_psa_crypto_se_driver_hal.function into a single copy in common test code so that it can be used in all test suites. No semantic change. Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>