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Add mbedtls_x509_get_name memory leak unit test

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Introduce a unit test to test mbedtls_x509_get_name() and add a testcase
with a corrupt DER-encoded name that causes mbedtls_x509_get_name() to
have to cleanup things it is allocated. If it fails to do this, a memory
leak is detected under Asan builds.

Signed-off-by: David Horstmann <david.horstmann@arm.com>
This commit is contained in:
David Horstmann
2022-10-04 16:49:16 +01:00
parent 05bb2c5d0e
commit db73d3b149
2 changed files with 42 additions and 0 deletions
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36
tests/suites/test_suite_x509parse.function
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@ -818,6 +818,42 @@ exit:
}
/* END_CASE */
/* BEGIN_CASE depends_on:MBEDTLS_X509_CRT_PARSE_C */
void mbedtls_x509_get_name( char * hex_name, int exp_ret )
{
unsigned char *name;
unsigned char *p;
size_t name_len;
mbedtls_x509_name head;
mbedtls_x509_name *allocated, *prev;
int res;
name = mbedtls_test_unhexify_alloc( hex_name, &name_len );
p = name;
res = mbedtls_x509_get_name( &p, ( name + name_len ), &head );
if( res == 0 )
{
allocated = head.next;
head.next = NULL;
prev = NULL;
while( allocated != NULL )
{
prev = allocated;
allocated = allocated->next;
mbedtls_free( prev );
}
}
TEST_ASSERT( res == exp_ret );
mbedtls_free( name );
}
/* END_CASE */
/* BEGIN_CASE depends_on:MBEDTLS_X509_CREATE_C:MBEDTLS_X509_USE_C:MBEDTLS_X509_CRT_PARSE_C:!MBEDTLS_X509_REMOVE_INFO */
void mbedtls_x509_dn_get_next( char * name_str, int next_merged, char * expected_oids, int exp_count, char * exp_dn_gets )
{