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gnulib/tests/test-exp-ieee.h
2026-01-01 10:37:05 -08:00

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1.2 KiB
C

/* Test of exp*() function family.
Copyright (C) 2012-2026 Free Software Foundation, Inc.
This program is free software: you can redistribute it and/or modify
it under the terms of the GNU General Public License as published by
the Free Software Foundation, either version 3 of the License, or
(at your option) any later version.
This program is distributed in the hope that it will be useful,
but WITHOUT ANY WARRANTY; without even the implied warranty of
MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
GNU General Public License for more details.
You should have received a copy of the GNU General Public License
along with this program. If not, see <https://www.gnu.org/licenses/>. */
static void
test_function (void)
{
/* [MX] shaded specification in POSIX. */
/* Underflow. */
{
volatile DOUBLE z = EXP (-100000.0);
ASSERT (z == L_(0.0));
ASSERT (!signbit (z));
}
/* NaN. */
ASSERT (ISNAN (EXP (NAN)));
/* Zero. */
ASSERT (EXP (L_(0.0)) == L_(1.0));
ASSERT (EXP (MINUS_ZERO) == L_(1.0));
/* Infinity. */
{
DOUBLE z = EXP (- INFINITY);
ASSERT (z == L_(0.0));
ASSERT (!signbit (z));
}
ASSERT (EXP (INFINITY) == INFINITY);
}