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WL#3206 (Add unit tests):
More changes according to review comments. unittest/README.txt: Changes to manifest. unittest/mysys/bitmap.t.c: Removed unused functions and variables. Marked unused parameters as unused. No need to test every size up to 4096 bits, testing to 1024, but I think this is too much as well. unittest/unit.pl: Added test for version-specific function.
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@ -24,15 +24,7 @@
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#include <my_global.h>
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#include <my_bitmap.h>
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static void bitmap_print(MY_BITMAP *map)
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{
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uint32 *to= map->bitmap, *end= map->last_word_ptr;
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while (to <= end)
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{
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fprintf(stderr,"0x%x ", *to++);
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}
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fprintf(stderr,"\n");
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}
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#include <string.h>
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uint get_rand_bit(uint bitsize)
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{
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@ -85,7 +77,8 @@ error2:
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return TRUE;
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}
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bool test_operators(MY_BITMAP *map, uint bitsize)
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bool test_operators(MY_BITMAP *map __attribute__((unused)),
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uint bitsize __attribute__((unused)))
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{
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return FALSE;
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}
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@ -266,7 +259,7 @@ error2:
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bool test_get_first_bit(MY_BITMAP *map, uint bitsize)
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{
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uint i, j, test_bit;
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uint i, test_bit;
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uint no_loops= bitsize > 128 ? 128 : bitsize;
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for (i=0; i < no_loops; i++)
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{
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@ -385,8 +378,10 @@ error:
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int main()
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{
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int i;
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plan(4095);
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for (i= 1; i < 4096; i++)
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int const min_size = 1;
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int const max_size = 1024;
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plan(max_size - min_size);
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for (i= min_size; i < max_size; i++)
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ok(do_test(i) == 0, "bitmap size %d", i);
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return exit_status();
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}
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