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Device side test library and test runner
This commit is contained in:
committed by
Ivan Grokhotkov
parent
33723a9b52
commit
ab7af89002
47
tests/device/test_tests/test_tests.ino
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47
tests/device/test_tests/test_tests.ino
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#include <BSTest.h>
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#include <test_config.h>
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BS_ENV_DECLARE();
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void setup()
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{
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Serial.begin(115200);
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BS_RUN(Serial);
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}
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TEST_CASE("this test runs successfully", "[bs]")
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{
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CHECK(1 + 1 == 2);
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REQUIRE(2 * 2 == 4);
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}
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TEST_CASE("another test which fails", "[bs][fail]")
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{
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CHECK(true);
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CHECK(false);
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CHECK(true);
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CHECK(false);
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}
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TEST_CASE("another test which fails and crashes", "[bs][fail]")
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{
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CHECK(true);
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REQUIRE(false);
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}
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TEST_CASE("third test which should be skipped", "[.]")
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{
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FAIL();
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}
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TEST_CASE("this test also runs successfully", "[bs]")
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{
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}
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void loop()
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{
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}
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